为了分析和评价地铁车站列车运行产生的振动与噪声对站厅工作环境的影响,对某地铁站的地面站厅层的振动与噪声进行现场实测,在时域内分析振动与噪声特性,并将实测结果与我国环境振动与噪声标准进行对比和分析,对不满足标准的办公室进行...为了分析和评价地铁车站列车运行产生的振动与噪声对站厅工作环境的影响,对某地铁站的地面站厅层的振动与噪声进行现场实测,在时域内分析振动与噪声特性,并将实测结果与我国环境振动与噪声标准进行对比和分析,对不满足标准的办公室进行减振降噪装饰处理。研究结果表明:当列车进出车站时,地面站厅结构竖向振动明显大于水平振动;实测的最大竖向振动加速度级为86.5~105.7 d B;站厅层楼板的振动明显大于其他位置处的振动;地面站厅内最大瞬时A声级为69.7~74.3 d B(A)。采取减振降噪措施后,办公室位置处的振动和噪声得到了较好改善。研究工作对类似工程的振动与噪声评价和减振降噪设计具有重要的参考价值。展开更多
Ta-doped In_2O_3 transparent conductive oxide films were deposited on glass substrates using radio-frequency (RF) sputtering at 300°C.The influence of post-annealing on the structural,morphologic,electrical and o...Ta-doped In_2O_3 transparent conductive oxide films were deposited on glass substrates using radio-frequency (RF) sputtering at 300°C.The influence of post-annealing on the structural,morphologic,electrical and optical properties of the films was investigated using X-ray diffraction,field emission scanning electron microscopy,Hall measurements and optical transmission spectroscopy.The obtained films were polycrystalline with a cubic structure and were preferentially oriented in the (222) crystallographic direction.The lowest resistivity,5.1×10 4 cm,was obtained in the film annealed at 500°C,which is half of that of the un-annealed film (9.9×10 4 cm).The average optical transmittance of the films was over 90%.The optical bandgap was found to decrease with increasing annealing temperature.展开更多
文摘为了分析和评价地铁车站列车运行产生的振动与噪声对站厅工作环境的影响,对某地铁站的地面站厅层的振动与噪声进行现场实测,在时域内分析振动与噪声特性,并将实测结果与我国环境振动与噪声标准进行对比和分析,对不满足标准的办公室进行减振降噪装饰处理。研究结果表明:当列车进出车站时,地面站厅结构竖向振动明显大于水平振动;实测的最大竖向振动加速度级为86.5~105.7 d B;站厅层楼板的振动明显大于其他位置处的振动;地面站厅内最大瞬时A声级为69.7~74.3 d B(A)。采取减振降噪措施后,办公室位置处的振动和噪声得到了较好改善。研究工作对类似工程的振动与噪声评价和减振降噪设计具有重要的参考价值。
基金supported by the National Natural Science Foundation of China (51003073/E0303)Tianjin Natural Science Foundation (08JCYBJC11400)
文摘Ta-doped In_2O_3 transparent conductive oxide films were deposited on glass substrates using radio-frequency (RF) sputtering at 300°C.The influence of post-annealing on the structural,morphologic,electrical and optical properties of the films was investigated using X-ray diffraction,field emission scanning electron microscopy,Hall measurements and optical transmission spectroscopy.The obtained films were polycrystalline with a cubic structure and were preferentially oriented in the (222) crystallographic direction.The lowest resistivity,5.1×10 4 cm,was obtained in the film annealed at 500°C,which is half of that of the un-annealed film (9.9×10 4 cm).The average optical transmittance of the films was over 90%.The optical bandgap was found to decrease with increasing annealing temperature.
