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Effect of Ge–GeO_2 co-doping on non-ohmic behaviour of TiO_2–V_2O_5–Y_2O_3 varistor ceramics 被引量:2
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作者 康昆勇 甘国友 +5 位作者 严继康 易建宏 张家敏 杜景红 赵文超 荣雪全 《Journal of Semiconductors》 EI CAS CSCD 2015年第7期39-44,共6页
An investigation was made into the effect of doping with the elemental crystal Ge or/and GeO2 on the TiO2-V2O5-Y2O3 varistor ceramics. The result shows that as the doping contents of V2O5 and Y2O3 are 0.5 tool%, respe... An investigation was made into the effect of doping with the elemental crystal Ge or/and GeO2 on the TiO2-V2O5-Y2O3 varistor ceramics. The result shows that as the doping contents of V2O5 and Y2O3 are 0.5 tool%, respectively, co-doping with 0.3 mol% Ge and 0.9 mol% GeO2 makes the highest α value (α = 12.8), the lowest breakdown voltage Vlmg (VlmA = 15.8 V/ram) and the highest grain boundary barrier ФB (ФB = 1.48 eV), which is remarkably superior to the TiO2-V2Os-Y203 varistor ceramics undoped with Ge and GeO2 and mono-doped with Ge or GeO2. The TiO2-V2Os-YEO3-Ge-GeO2 ceramic has the prospect of becoming a novel varistor ceramic with excellent electrical properties. 展开更多
关键词 TiO2 varistor CO-DOPING nonlinear coefficient breakdown voltage ge and geo2
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一种创新结构宽波段中红外空芯光纤的设计与研究 被引量:1
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作者 侯峙云 洪文学 +2 位作者 赵兵 韩华 侯蓝田 《红外与毫米波学报》 SCIE EI CAS CSCD 北大核心 2013年第1期28-31,96,共5页
提出一种双包层结构Ge/GeO2介质膜空芯中红外光纤.先采用排布法拉制出包层带有多层空气孔的空芯毛细管,最外层涂有一层硅胶,以加强其机械强度,然后利用化学气相沉积和还原方法在空芯石英毛细管中制备出GeO2-Ge的多层介质反射膜,该膜层... 提出一种双包层结构Ge/GeO2介质膜空芯中红外光纤.先采用排布法拉制出包层带有多层空气孔的空芯毛细管,最外层涂有一层硅胶,以加强其机械强度,然后利用化学气相沉积和还原方法在空芯石英毛细管中制备出GeO2-Ge的多层介质反射膜,该膜层提高了Ge/GeO2膜层在短波段的反射效率.经光谱检测分析,该光纤可传输波长为3-12μm,并且中间没有出现大的吸收峰. 展开更多
关键词 多层介质膜 ge geo2 宽波段
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High-Pressure Oxidation on Ge:Improvement of Ge/GeO2 Interface and GeO2 Bulk Properties
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作者 Choong Hyun Lee 《Journal of Microelectronic Manufacturing》 2020年第2期6-11,共6页
On the basis of thermodynamic and kinetic consideration of Ge-O system,high-pressure oxidation(HPO)on Ge was proposed to suppress the GeO desorption during the thermal oxidation and significant improvements of Ge/GeO2... On the basis of thermodynamic and kinetic consideration of Ge-O system,high-pressure oxidation(HPO)on Ge was proposed to suppress the GeO desorption during the thermal oxidation and significant improvements of Ge/GeO2-based gate stacks have been achieved.It is found that the post oxidation annealing at lower temperatures is helpful to passivate the interface defects at the Ge/GeO2 stack generated by the conventional thermal oxidation,while the high-quality GeO2 bulk properties can only be achieved by HPO that grows GeO2 film at high temperatures without the GeO desorption.This paper reviews the advantage of HPO on the formation of Ge/GeO2 stacks in terms of Ge/GeO2 interface and GeO2 bulk properties. 展开更多
关键词 High-pressure oxidation ge oxidation High mobility channel ge/geo2 interface Interface trap density
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