The failure mechanism stimulated by accelerated stress in the degradation may be different from that under normal conditions, which would lead to invalid accelerated life tests. To solve the problem, we study the re- ...The failure mechanism stimulated by accelerated stress in the degradation may be different from that under normal conditions, which would lead to invalid accelerated life tests. To solve the problem, we study the re- lation between the Arrhenius equation and the lognormal distribution in the degradation process. Two relationships of the lognormal distribution parameters must be satisfied in the conclusion of the unaltered failure mechanism, the first is that the logarithmic standard deviations must be equivalent at different temperature levels, and the second is that the ratio of the differences between logarithmic means must be equal to the ratio of the differences between reciprocals of temperature. The logarithm of distribution lines must simultaneously have the same slope and regular interval lines. We studied the degradation of thick-film resistors in MCM by accelerated stress at four temperature levels （390, 400, 410 and 420 K）, and the result agreed well with our method.展开更多
To estimate the life of vacuum fluorescent display （VFD） more accurately and reduce test time and cost, four constant stress accelerated life tests （CSALTs） were conducted on an accelerated life test model. In the...To estimate the life of vacuum fluorescent display （VFD） more accurately and reduce test time and cost, four constant stress accelerated life tests （CSALTs） were conducted on an accelerated life test model. In the model, statistical analysis of test data is achieved by applying lognormal function to describe the life distribution, and least square method （LSM） to calculate the mean value and the standard deviation of logarithm. As a result, the accelerated life equation was obtained, and then a self-developed software was developed to predict the VFD life. The data analysis results demonstrate that the VFD life submits to lognormal distribution, that the accelerated model meets the linear Arrhenius equation, and that the precise accelerated parameter makes it possible to acquire the life information of VFD within one month.展开更多
基金Project supported by the National Natural Science Foundation of China(No.61204081)the Research Project in Guangdong Province,China(No.2011B090400463)the Guangdong Provincial Science and Technology Major Project of the Ministry of Science and Technology of China(Nos.2011A080801005,2012A080304003)
文摘The failure mechanism stimulated by accelerated stress in the degradation may be different from that under normal conditions, which would lead to invalid accelerated life tests. To solve the problem, we study the re- lation between the Arrhenius equation and the lognormal distribution in the degradation process. Two relationships of the lognormal distribution parameters must be satisfied in the conclusion of the unaltered failure mechanism, the first is that the logarithmic standard deviations must be equivalent at different temperature levels, and the second is that the ratio of the differences between logarithmic means must be equal to the ratio of the differences between reciprocals of temperature. The logarithm of distribution lines must simultaneously have the same slope and regular interval lines. We studied the degradation of thick-film resistors in MCM by accelerated stress at four temperature levels （390, 400, 410 and 420 K）, and the result agreed well with our method.
基金Shanghai Municipal Natural Science Foun-dation (NO.09ZR1413000)Undergraduate Education High-land Construction Project of ShanghaiKey Technology R&D Program of Shanghai Municipality (No.08160510600)
文摘To estimate the life of vacuum fluorescent display （VFD） more accurately and reduce test time and cost, four constant stress accelerated life tests （CSALTs） were conducted on an accelerated life test model. In the model, statistical analysis of test data is achieved by applying lognormal function to describe the life distribution, and least square method （LSM） to calculate the mean value and the standard deviation of logarithm. As a result, the accelerated life equation was obtained, and then a self-developed software was developed to predict the VFD life. The data analysis results demonstrate that the VFD life submits to lognormal distribution, that the accelerated model meets the linear Arrhenius equation, and that the precise accelerated parameter makes it possible to acquire the life information of VFD within one month.
