A neural network model with a classical annotation method has been used on the EXL-50tokamak to predict impending disruption.However,the results revealed issues of overfitting and overconfidence in predictions caused ...A neural network model with a classical annotation method has been used on the EXL-50tokamak to predict impending disruption.However,the results revealed issues of overfitting and overconfidence in predictions caused by inaccurate labeling.To mitigate these issues,an improved training framework has been proposed.In this approach,soft labels from previous training serve as teachers to supervise the further learning process;this has lead to a significant improvement in predictive model performance.Notably,this enhancement is primarily attributed to the coupling effect of the soft labels and correction mechanism.This improved training framework introduces an instance-specific label smoothing method,which reflects a more nuanced model assessment on the likelihood of a disruption.It presents a possible solution to effectively address the challenges associated with accurate labeling across different machines.展开更多
Electronic properties of two-dimensional(2D) materials can be strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy(KPFM) is usually limited in a few hund...Electronic properties of two-dimensional(2D) materials can be strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy(KPFM) is usually limited in a few hundreds of nanometers, and it is difficult to characterize localized electronic properties of 2D materials at nanoscales. Herein, tip-enhanced Raman spectroscopy(TERS) is proposed to combine with KPFM to break this restriction. TERS scan is conducted on ReS2bubbles deposited on a rough Au thin film to obtain strain distribution by using the Raman peak shift. The localized contact potential difference(CPD) is inversely calculated with a higher spatial resolution by using strain measured by TERS and CPD-strain working curve obtained using conventional KPFM and atomic force microscopy. This method enhances the spatial resolution of CPD measurements and can be potentially used to characterize localized electronic properties of 2D materials.展开更多
基金supported by National Natural Science Foundation of China(Nos.12175277 and 11975271)the National Key R&D Program of China(No.2022YFE 03050003)。
文摘A neural network model with a classical annotation method has been used on the EXL-50tokamak to predict impending disruption.However,the results revealed issues of overfitting and overconfidence in predictions caused by inaccurate labeling.To mitigate these issues,an improved training framework has been proposed.In this approach,soft labels from previous training serve as teachers to supervise the further learning process;this has lead to a significant improvement in predictive model performance.Notably,this enhancement is primarily attributed to the coupling effect of the soft labels and correction mechanism.This improved training framework introduces an instance-specific label smoothing method,which reflects a more nuanced model assessment on the likelihood of a disruption.It presents a possible solution to effectively address the challenges associated with accurate labeling across different machines.
基金financially supported by the National Natural Science Foundation of China(Grant no.21935009)the National Key R&D Program of China(Grant No.2021YFB2401800)。
基金Project supported by the Zhejiang Provincial Natural Science Foundation of China (Grant No. LZ22A040003)the National Natural Science Foundation of China (Grant No. 52027809)。
文摘Electronic properties of two-dimensional(2D) materials can be strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy(KPFM) is usually limited in a few hundreds of nanometers, and it is difficult to characterize localized electronic properties of 2D materials at nanoscales. Herein, tip-enhanced Raman spectroscopy(TERS) is proposed to combine with KPFM to break this restriction. TERS scan is conducted on ReS2bubbles deposited on a rough Au thin film to obtain strain distribution by using the Raman peak shift. The localized contact potential difference(CPD) is inversely calculated with a higher spatial resolution by using strain measured by TERS and CPD-strain working curve obtained using conventional KPFM and atomic force microscopy. This method enhances the spatial resolution of CPD measurements and can be potentially used to characterize localized electronic properties of 2D materials.
