<strong>Background: </strong><span style="font-family:Verdana;">Radial artery catheterization is a fundamental approach that is used as a procedural access in the different catheterization ...<strong>Background: </strong><span style="font-family:Verdana;">Radial artery catheterization is a fundamental approach that is used as a procedural access in the different catheterization laboratories so our study is a</span><span style="font-family:Verdana;"> </span><span style="font-family:Verdana;">compari</span><span style="font-family:Verdana;">s</span><span style="font-family:;" "=""><span style="font-family:Verdana;">on between distal radial artery approach and convential traditional transradial approach to explore the fesibility and safety of coronary angiography and percutanous coronary. </span><b><span style="font-family:Verdana;">Aim of the Work: </span></b><span style="font-family:Verdana;">The purpose of our study is a comparison between the conventional transradial approach versus distal transradial approach for diagnostic and interventional coronary procedures. </span><b><span style="font-family:Verdana;">Materials and Methods: </span></b><span style="font-family:Verdana;">This </span></span><span style="font-family:Verdana;">is </span><span style="font-family:Verdana;">a</span><span style="font-family:Verdana;"> </span><span style="font-family:Verdana;">prospective study that included 60 patients who presented to the Cardiology departments in Ahmed Maher</span><span style="font-family:Verdana;"> </span><span style="font-family:Verdana;">Teaching Hospital from December 2018 until October 2019 to perform planned Transradial Coronary Angiography and/or coronary intervention</span><span style="font-family:Verdana;">.</span><span style="font-family:Verdana;"> </span><span style="font-family:Verdana;">T</span><span style="font-family:Verdana;">he study </span><span style="font-family:Verdana;">is </span><span style="font-family:;" "=""><span style="font-family:Verdana;">divided into two groups, group (A) included 30 patients who undergone the procedure through the distal radial approach (The Anatomical Snuffbox)</span><b></b><span style="font-family:Verdana;">and group (B) included 30 patients who unde展开更多
This paper focuses on the production testing of Memristor Ratioed Logic (MRL) gates. MRL is a family that uses memristors along with CMOS inverters to design logic gates. Two-input NAND and NOR gates are inv...This paper focuses on the production testing of Memristor Ratioed Logic (MRL) gates. MRL is a family that uses memristors along with CMOS inverters to design logic gates. Two-input NAND and NOR gates are investigated using the stuck at fault model for the memristors and the five-fault model for the transistors. Test escapes may take place while testing faults in the memristors. Therefore, two solutions are proposed to obtain full coverage for the MRL NAND and NOR gates. The first is to apply scaled input voltages and the second is to change the switching threshold of the CMOS inverter. In addition, it is shown that test speed and order should be taken into consideration. It is proven that three ordered test vectors are needed for full coverage in MRL NAND and NOR gates, which is different from the order required to obtain 100% coverage in the conventional NAND and NOR CMOS designs.展开更多
文摘<strong>Background: </strong><span style="font-family:Verdana;">Radial artery catheterization is a fundamental approach that is used as a procedural access in the different catheterization laboratories so our study is a</span><span style="font-family:Verdana;"> </span><span style="font-family:Verdana;">compari</span><span style="font-family:Verdana;">s</span><span style="font-family:;" "=""><span style="font-family:Verdana;">on between distal radial artery approach and convential traditional transradial approach to explore the fesibility and safety of coronary angiography and percutanous coronary. </span><b><span style="font-family:Verdana;">Aim of the Work: </span></b><span style="font-family:Verdana;">The purpose of our study is a comparison between the conventional transradial approach versus distal transradial approach for diagnostic and interventional coronary procedures. </span><b><span style="font-family:Verdana;">Materials and Methods: </span></b><span style="font-family:Verdana;">This </span></span><span style="font-family:Verdana;">is </span><span style="font-family:Verdana;">a</span><span style="font-family:Verdana;"> </span><span style="font-family:Verdana;">prospective study that included 60 patients who presented to the Cardiology departments in Ahmed Maher</span><span style="font-family:Verdana;"> </span><span style="font-family:Verdana;">Teaching Hospital from December 2018 until October 2019 to perform planned Transradial Coronary Angiography and/or coronary intervention</span><span style="font-family:Verdana;">.</span><span style="font-family:Verdana;"> </span><span style="font-family:Verdana;">T</span><span style="font-family:Verdana;">he study </span><span style="font-family:Verdana;">is </span><span style="font-family:;" "=""><span style="font-family:Verdana;">divided into two groups, group (A) included 30 patients who undergone the procedure through the distal radial approach (The Anatomical Snuffbox)</span><b></b><span style="font-family:Verdana;">and group (B) included 30 patients who unde
文摘This paper focuses on the production testing of Memristor Ratioed Logic (MRL) gates. MRL is a family that uses memristors along with CMOS inverters to design logic gates. Two-input NAND and NOR gates are investigated using the stuck at fault model for the memristors and the five-fault model for the transistors. Test escapes may take place while testing faults in the memristors. Therefore, two solutions are proposed to obtain full coverage for the MRL NAND and NOR gates. The first is to apply scaled input voltages and the second is to change the switching threshold of the CMOS inverter. In addition, it is shown that test speed and order should be taken into consideration. It is proven that three ordered test vectors are needed for full coverage in MRL NAND and NOR gates, which is different from the order required to obtain 100% coverage in the conventional NAND and NOR CMOS designs.
