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Ta_(2)NiSe_(5)/GaN范德华异质结用于具有超高响应性和耐恶劣环境的紫外光电探测器
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作者 雷剑鹏 +6 位作者 吴望龙 照强 王小周 肖文波 李京波 杨孟孟 《Science China Materials》 SCIE EI CAS CSCD 2024年第3期863-870,共8页
氮化镓由于其直接带隙、固有的紫外吸收和高击穿电压引起了人们对其在紫外光电探测领域的极大研究兴趣.在本工作中,我们成功地将新型三元硫族化合物Ta_(2)NiSe_(5)与非故意掺杂的GaN堆叠,形成了具有典型I型能带排列的混合维度的Ta_(2)Ni... 氮化镓由于其直接带隙、固有的紫外吸收和高击穿电压引起了人们对其在紫外光电探测领域的极大研究兴趣.在本工作中,我们成功地将新型三元硫族化合物Ta_(2)NiSe_(5)与非故意掺杂的GaN堆叠,形成了具有典型I型能带排列的混合维度的Ta_(2)NiSe_(5)/GaN(2D/3D)范德瓦尔斯异质结构.该异质结构表现出优异的紫外探测性能(光开关比为10~7,响应度为1.22×10^(4)A W^(-1)).此外,在365 nm的光照和4 V的偏压下,探测度提高至1.3×10^(16)Jones,并表现出1.22/31.6 ms的快速响应速率.值得注意的是,该器件还具有优异的稳定性、可重复性和抗恶劣环境条件(包括高温和酸性条件)的耐受性.得益于光电探测器的高响应度、探测度和光开关比,我们成功地将该异质结构器件集成到紫外光通信中,证明了Ta_(2)NiSe_(5)/GaN光电探测器在信息传输中有着优异的应用前景. 展开更多
关键词 GAN Ta_(2)NiSe_(5) HETEROJUNCTION UV photodetector super-high responsivity harsh environment-resistant
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Investigation into epitaxial growth optimization of a novel AlGaN/GaN HEMT structure for application in UV photodetectors
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作者 Zhiyuan Liu Wanglong Wu +7 位作者 Xiong Yang Menglong Zhang Lixiang Han Jianpeng Lei Quansheng Zheng Nengjie Huo Xiaozhou Wang Jingbo Li 《Science China Materials》 SCIE EI CAS CSCD 2024年第9期2828-2837,共10页
In this work,a novel ultraviolet(UV)photodetector(PD)based on AlGaN/u-GaN/p-GaN/u-GaN heterojunction high electron mobility transistor(HEMT)has been developed.This HEMT epilayer is grown using the metal-organic chemic... In this work,a novel ultraviolet(UV)photodetector(PD)based on AlGaN/u-GaN/p-GaN/u-GaN heterojunction high electron mobility transistor(HEMT)has been developed.This HEMT epilayer is grown using the metal-organic chemical vapor deposition(MOCVD)technique,and the growth parameters,including the AlGaN growth temperature,preheating temperature of the p-GaN layer,and NH3/N2 flow rate,are optimized to improve the quality of the epilayer.The optimized epilayer exhibits a flat surface with a root mean square value of 0.146 nm and low dislocation density.The p-GaN thickness in epitaxial wafers has a significant influence on electrical and UV photoresponse.With a p-GaN of 1µm,the UV PD demonstrates a significant switching ratio and transconductance of 107 and 127.3 mS mm^(-1),respectively.Acting as a UV PD,it also exhibits a high light on/off ratio(I_(light)/I_(dark))of 6.35×10^(5),a high responsivity(R)of 48.11 A W^(-1),and a detectivity(D*)of 6.85×10^(12)Jones under 365-nm UV illumination with light power density of 86.972 mW cm^(-2).The high-performance HEMT and UV detectors,which incorporate p-GaN etchless technology,have been refined through advancements in epitaxial growth and structural design.These improvements solidify the groundwork for large-scale manufacturing of UV communication systems and laser diodes. 展开更多
关键词 AlGaN/GaN-based HEMT epitaxial growth by MOCVD p-GaN/u-GaN junction UV photodetector
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