使用不同化学外加剂对贵阳电厂、清镇电厂的陈积粉煤灰加气混凝土进行活性试验,测试试件的抗压、抗折强度。试验发现:Na Cl和Na2SO4的激发效果明显;单掺化学试剂Na Al O2或者Na Al O2和石膏复掺对粉煤灰的活性激发效果都不明显,原因可能...使用不同化学外加剂对贵阳电厂、清镇电厂的陈积粉煤灰加气混凝土进行活性试验,测试试件的抗压、抗折强度。试验发现:Na Cl和Na2SO4的激发效果明显;单掺化学试剂Na Al O2或者Na Al O2和石膏复掺对粉煤灰的活性激发效果都不明显,原因可能是Na Al O2导致成型时需水量增加,试件成型不致密,强度降低。展开更多
A novel local-dielectric-thickening technique i s presented for performance improvements of Si-based spiral inductors.This technique employs the processes of deposition,photolithography,and wet-etching,to locally thic...A novel local-dielectric-thickening technique i s presented for performance improvements of Si-based spiral inductors.This technique employs the processes of deposition,photolithography,and wet-etching,to locally thicken the oxide layer under the inductor,which can decrease the substrate loss and improve the inductor performance.Both the structures and processes are compact,economical,and compatible with CMOS processing.Several square spiral inductors with different inductances are fabricated,and the quality factors and the self-resonant frequencies both increase clearly with this proposed technique:for the 10nH,5nH,and 2nH inductors,the peak quality factors are effectively improved by 46.7%,49.7%,and 68.6%,respectively;however,the improvement percents of the self-resonant frequencies are more significant,which are 92.1%,91.0%,and no less than 68.1% respectively.展开更多
利用原子力显微镜(AFM)和扫描电镜(SEM)对磁存储器(MRAM)驱动电路与存储单元--磁性隧道结(MTJ)的连接界面的表面平坦化进行了研究.原子力显微镜照片表明:磁控溅射沉积的金属铝膜的表面由尺寸约为300nm的颗粒组成,其表面粗糙度约为几十...利用原子力显微镜(AFM)和扫描电镜(SEM)对磁存储器(MRAM)驱动电路与存储单元--磁性隧道结(MTJ)的连接界面的表面平坦化进行了研究.原子力显微镜照片表明:磁控溅射沉积的金属铝膜的表面由尺寸约为300nm的颗粒组成,其表面粗糙度约为几十纳米的量级,用统计平均值(均方根值root mean square,RMS)描述约为10nm;在铝膜的表面沉积一层难溶金属Ti或Ta膜以后,可很好地改善过渡层金属表面的平坦化效果.通过用化学机械平坦化设备(chemical mechanical planarization,CMP)在小压力和低转速的条件下,可使过渡层金属表面的RMS值达到小于1nm的平坦化效果.扫描电镜照片的结果也显示:利用光刻胶平坦化,然后通过调节反应离子刻蚀的条件,使刻蚀的过程中对氧化硅和光刻胶的刻蚀速率相等,去掉光刻胶,达到平坦化整个芯片表面的效果.展开更多
Device structure and fabrication process of SOI nMOSFET depleted partially are p roposed for multi-gigahertz RF applications.Many advanced techniques for deep submiron MOSFETs are incorporated into the proposed devic...Device structure and fabrication process of SOI nMOSFET depleted partially are p roposed for multi-gigahertz RF applications.Many advanced techniques for deep submiron MOSFETs are incorporated into the proposed device.Main steps and condit ions in process are given in details,with simulation and optimization by using t he process simulator,Tsuprem4.Experiment results of 0.25μm SOI RF nMOSFET are i n consistence with simulated ones,and excellent or acceptable parameters of devi ce performance are obtained for multi-gigahertz RF applications.展开更多
文摘使用不同化学外加剂对贵阳电厂、清镇电厂的陈积粉煤灰加气混凝土进行活性试验,测试试件的抗压、抗折强度。试验发现:Na Cl和Na2SO4的激发效果明显;单掺化学试剂Na Al O2或者Na Al O2和石膏复掺对粉煤灰的活性激发效果都不明显,原因可能是Na Al O2导致成型时需水量增加,试件成型不致密,强度降低。
文摘A novel local-dielectric-thickening technique i s presented for performance improvements of Si-based spiral inductors.This technique employs the processes of deposition,photolithography,and wet-etching,to locally thicken the oxide layer under the inductor,which can decrease the substrate loss and improve the inductor performance.Both the structures and processes are compact,economical,and compatible with CMOS processing.Several square spiral inductors with different inductances are fabricated,and the quality factors and the self-resonant frequencies both increase clearly with this proposed technique:for the 10nH,5nH,and 2nH inductors,the peak quality factors are effectively improved by 46.7%,49.7%,and 68.6%,respectively;however,the improvement percents of the self-resonant frequencies are more significant,which are 92.1%,91.0%,and no less than 68.1% respectively.
文摘利用原子力显微镜(AFM)和扫描电镜(SEM)对磁存储器(MRAM)驱动电路与存储单元--磁性隧道结(MTJ)的连接界面的表面平坦化进行了研究.原子力显微镜照片表明:磁控溅射沉积的金属铝膜的表面由尺寸约为300nm的颗粒组成,其表面粗糙度约为几十纳米的量级,用统计平均值(均方根值root mean square,RMS)描述约为10nm;在铝膜的表面沉积一层难溶金属Ti或Ta膜以后,可很好地改善过渡层金属表面的平坦化效果.通过用化学机械平坦化设备(chemical mechanical planarization,CMP)在小压力和低转速的条件下,可使过渡层金属表面的RMS值达到小于1nm的平坦化效果.扫描电镜照片的结果也显示:利用光刻胶平坦化,然后通过调节反应离子刻蚀的条件,使刻蚀的过程中对氧化硅和光刻胶的刻蚀速率相等,去掉光刻胶,达到平坦化整个芯片表面的效果.
文摘Device structure and fabrication process of SOI nMOSFET depleted partially are p roposed for multi-gigahertz RF applications.Many advanced techniques for deep submiron MOSFETs are incorporated into the proposed device.Main steps and condit ions in process are given in details,with simulation and optimization by using t he process simulator,Tsuprem4.Experiment results of 0.25μm SOI RF nMOSFET are i n consistence with simulated ones,and excellent or acceptable parameters of devi ce performance are obtained for multi-gigahertz RF applications.
