A patterned Au/Pt/In0.2Ga0.8N/GaN heterostructure Sehottky prototype solar cell is fabricated. The forward current-voltage characteristics indicate that thermionie emission is a dominant current transport mechanism at...A patterned Au/Pt/In0.2Ga0.8N/GaN heterostructure Sehottky prototype solar cell is fabricated. The forward current-voltage characteristics indicate that thermionie emission is a dominant current transport mechanism at the Pt/InGaN interface in our fabricated cell. The Sehottky solar cell has an open-circuit voltage of 0.91 V, short-circuit current density of 7mA/cm^2, and fill factor of 0.45 when illuminated by a Xe lamp with a power density of 300 mW/cm^2. It exhibits a higher short-circuit current density of 30 mA/cm^2 and an external quantum efficiency of over 25% when illuminated by a 20-roW-power He-Cd laser.展开更多
We investigate the negative transconductance effect in p-GaN gate AlGaN/GaN high-electron-mobility transistor(HEMT) associated with traps in the unintentionally doped GaN buffer layer. We find that a negative transcon...We investigate the negative transconductance effect in p-GaN gate AlGaN/GaN high-electron-mobility transistor(HEMT) associated with traps in the unintentionally doped GaN buffer layer. We find that a negative transconductance effect occurs with increasing the trap concentration and capture cross section when calculating transfer characteristics.The electron tunneling through AlGaN barrier and the reduced electric field discrepancy between drain side and gate side induced by traps are reasonably explained by analyzing the band diagrams, output characteristics, and the electric field strength of the channel of the devices under different trap concentrations and capture cross sections.展开更多
InGaN layers capped with GaN were annealed at 550℃ for 1 hour. During annealing, cracks appeared and dissolved In GaN penetrated through the microcracks into the V-pits to form indium-rich nanoprecipitates. Some prec...InGaN layers capped with GaN were annealed at 550℃ for 1 hour. During annealing, cracks appeared and dissolved In GaN penetrated through the microcracks into the V-pits to form indium-rich nanoprecipitates. Some precipitates, in-situ annealed under nitrogen ion irradiation by MBE, were confirmed to be cubic GaN on the tops of precipitates, formed by nitriding the pre-existing Ga droplets under nitrogen ions irradiation.展开更多
基金Supported by the National High-Tech Research and Development Program of China under Grant No 2007AA06A405, the National Natural Science Foundation of China under Grant Nos 60676057 and 60721063, the National Basic Research Program of China under Grant No 2009CB320300, and the Natural Science Foundation of Jiangsu Province （BK2006126, BK2008019）.
文摘A patterned Au/Pt/In0.2Ga0.8N/GaN heterostructure Sehottky prototype solar cell is fabricated. The forward current-voltage characteristics indicate that thermionie emission is a dominant current transport mechanism at the Pt/InGaN interface in our fabricated cell. The Sehottky solar cell has an open-circuit voltage of 0.91 V, short-circuit current density of 7mA/cm^2, and fill factor of 0.45 when illuminated by a Xe lamp with a power density of 300 mW/cm^2. It exhibits a higher short-circuit current density of 30 mA/cm^2 and an external quantum efficiency of over 25% when illuminated by a 20-roW-power He-Cd laser.
基金Project supported by the National Key Research and Development Program of China(Grant No.2017YFB0402900)the National Natural Science Foundation of China(Grant No.61634002)+1 种基金the Scientific Research Foundation of Graduate School of Nanjing University,China(Grant No.2016CL03)the Key Project of Jiangsu Province,China(Grant No.BE2016174)
文摘We investigate the negative transconductance effect in p-GaN gate AlGaN/GaN high-electron-mobility transistor(HEMT) associated with traps in the unintentionally doped GaN buffer layer. We find that a negative transconductance effect occurs with increasing the trap concentration and capture cross section when calculating transfer characteristics.The electron tunneling through AlGaN barrier and the reduced electric field discrepancy between drain side and gate side induced by traps are reasonably explained by analyzing the band diagrams, output characteristics, and the electric field strength of the channel of the devices under different trap concentrations and capture cross sections.
基金Project supported by the National Natural Science Foundation of China(Grant Nos.61604080,61574079,61634002,and 61474060)Natural Science Foundation of Jiangsu Province,China(Grant No.BK20160883)+1 种基金University Science Research Project of Jiangsu Province,China(Grant Nos.16KJB140011 and14KJB510020)NUPTSF,China(Grant No.NY214154)
文摘InGaN layers capped with GaN were annealed at 550℃ for 1 hour. During annealing, cracks appeared and dissolved In GaN penetrated through the microcracks into the V-pits to form indium-rich nanoprecipitates. Some precipitates, in-situ annealed under nitrogen ion irradiation by MBE, were confirmed to be cubic GaN on the tops of precipitates, formed by nitriding the pre-existing Ga droplets under nitrogen ions irradiation.
