实验利用YAG/Nd∶YAG/Cr4+∶YAG键合晶体和光子晶体光栅镜获得高峰值功率和高光束质量的被动调Q径向脉冲激光输出,激光器的输出功率达到435 m W,斜率效率为14.7%。在吸收抽运功率为6.8 W时,输出激光脉冲的峰值功率达到15.7 k W,脉冲能...实验利用YAG/Nd∶YAG/Cr4+∶YAG键合晶体和光子晶体光栅镜获得高峰值功率和高光束质量的被动调Q径向脉冲激光输出,激光器的输出功率达到435 m W,斜率效率为14.7%。在吸收抽运功率为6.8 W时,输出激光脉冲的峰值功率达到15.7 k W,脉冲能量达到50.1 m J,脉冲宽度为3.2 ns,重复频率为8.1 k Hz,径向偏振纯度为95.8%。实验中的晶体均采用<111>的切割方向,输出径向偏振光束的均匀性得到提高。展开更多
Single layer lattice graphene deposited on the metal substrate can hardly be imaged by the optical microscope. In this Letter, a large field-of-view imaging ellipsometer is introduced to image single layer graphene wh...Single layer lattice graphene deposited on the metal substrate can hardly be imaged by the optical microscope. In this Letter, a large field-of-view imaging ellipsometer is introduced to image single layer graphene which is deposited on a metal substrate. By adjusting the polarizer and the analyzer of imaging ellipsometer, the light reflected from surfaces of either single layer graphene or a Au film substrate can be extinguished, respectively.Thus, single layer graphene can be imaged correspondingly under brightfield or darkfield imaging modes. The method can be applied to imaging large-area graphene on a metal substrate.展开更多
文摘实验利用YAG/Nd∶YAG/Cr4+∶YAG键合晶体和光子晶体光栅镜获得高峰值功率和高光束质量的被动调Q径向脉冲激光输出,激光器的输出功率达到435 m W,斜率效率为14.7%。在吸收抽运功率为6.8 W时,输出激光脉冲的峰值功率达到15.7 k W,脉冲能量达到50.1 m J,脉冲宽度为3.2 ns,重复频率为8.1 k Hz,径向偏振纯度为95.8%。实验中的晶体均采用<111>的切割方向,输出径向偏振光束的均匀性得到提高。
基金supported by the Intergovernmental International Cooperation Program in Science and Technology Innovation(No.2016YFE0110600)the International Science&Technology Cooperation Program of Shanghai(No.16520710500)+2 种基金the National Natural Science Foundation of China(No.51605473)the Youth Innovation Promotion Association of CAS,the Science and Technology Commission of Shanghai Municipality(No.17YF1429500)the Shanghai Sailing Program(No.18YF1426500)
文摘Single layer lattice graphene deposited on the metal substrate can hardly be imaged by the optical microscope. In this Letter, a large field-of-view imaging ellipsometer is introduced to image single layer graphene which is deposited on a metal substrate. By adjusting the polarizer and the analyzer of imaging ellipsometer, the light reflected from surfaces of either single layer graphene or a Au film substrate can be extinguished, respectively.Thus, single layer graphene can be imaged correspondingly under brightfield or darkfield imaging modes. The method can be applied to imaging large-area graphene on a metal substrate.
