Yttria stabilized zirconia(YSZ) was deposited on the line cut β-NiAl substrate by electron-beam physical vapour deposition(EB-PVD), and the cyclic oxidation behaviors of thermal barrier coatings on β-NiAl substrate ...Yttria stabilized zirconia(YSZ) was deposited on the line cut β-NiAl substrate by electron-beam physical vapour deposition(EB-PVD), and the cyclic oxidation behaviors of thermal barrier coatings on β-NiAl substrate were investigated in 1 h thermal cycles at 1 200 ℃ in air. The results show that the samples fail after 80?100 cycles. Sub-interface cavitations in the substrate develop due to depletion of Al in forming thermally grown oxides(TGOs). The collapse and closing up of cavities result in the ragged YSZ/TGO/substrate interface. Since the specific crack trajectories are quite sensitive to local geometry, cracks along the YSZ/TGO/substrate interfaces ultimately lead to YSZ spallation.展开更多
基金Project（50571005） supported by the National Natural Science Foundation of China.Acknowledgement The authors would like to thank ZH0U Chun-gen for prolitable discussion about SEM/EDS analysis.
基金Project(50571005) supported by the National Natural Science Foundation of China
文摘Yttria stabilized zirconia(YSZ) was deposited on the line cut β-NiAl substrate by electron-beam physical vapour deposition(EB-PVD), and the cyclic oxidation behaviors of thermal barrier coatings on β-NiAl substrate were investigated in 1 h thermal cycles at 1 200 ℃ in air. The results show that the samples fail after 80?100 cycles. Sub-interface cavitations in the substrate develop due to depletion of Al in forming thermally grown oxides(TGOs). The collapse and closing up of cavities result in the ragged YSZ/TGO/substrate interface. Since the specific crack trajectories are quite sensitive to local geometry, cracks along the YSZ/TGO/substrate interfaces ultimately lead to YSZ spallation.
