The environmental background values of 13 elements of Hg, As, Se, Cr,Mn, V, Ph, Cd, Zn, Cu, Ni, F and Co in xizang soils are obtained through analyzing and determining 205 samples of surface soils in Tibet and the fin...The environmental background values of 13 elements of Hg, As, Se, Cr,Mn, V, Ph, Cd, Zn, Cu, Ni, F and Co in xizang soils are obtained through analyzing and determining 205 samples of surface soils in Tibet and the final data processing. The background val展开更多
Microstructures of high J_c YBCO thin film deposited on the 30 mm × 30 mm LaAlO_3 substrate byusing a hollow cylinder cathode DC magnetron sputtering technique were studied with an AEM andHREM. The c -axis orient...Microstructures of high J_c YBCO thin film deposited on the 30 mm × 30 mm LaAlO_3 substrate byusing a hollow cylinder cathode DC magnetron sputtering technique were studied with an AEM andHREM. The c -axis oriented TBCO thin film included a few Y_2 BaCuO_5 particles and spindle - like Y_2 O_3oxide. [001] edge and screw dislocations, stacking faults and other planar defects, lattice distorted regionsless than 15 nm and cation vacancies were found in the film. On the substrate surface the first layer filmatoms were CuO and CuO_2 layer so that the BaCuO_2 and YBaCu_2O_5 phases was formed at the interface.The step-like substrate surface, small pits on the surface and dislocations in the substrate surface layer obvi-ously effected on the epitaxial growth of the film and forniation of the defects in the film. The effect of thedefects on the J_c was discussed.展开更多
文摘The environmental background values of 13 elements of Hg, As, Se, Cr,Mn, V, Ph, Cd, Zn, Cu, Ni, F and Co in xizang soils are obtained through analyzing and determining 205 samples of surface soils in Tibet and the final data processing. The background val
文摘Microstructures of high J_c YBCO thin film deposited on the 30 mm × 30 mm LaAlO_3 substrate byusing a hollow cylinder cathode DC magnetron sputtering technique were studied with an AEM andHREM. The c -axis oriented TBCO thin film included a few Y_2 BaCuO_5 particles and spindle - like Y_2 O_3oxide. [001] edge and screw dislocations, stacking faults and other planar defects, lattice distorted regionsless than 15 nm and cation vacancies were found in the film. On the substrate surface the first layer filmatoms were CuO and CuO_2 layer so that the BaCuO_2 and YBaCu_2O_5 phases was formed at the interface.The step-like substrate surface, small pits on the surface and dislocations in the substrate surface layer obvi-ously effected on the epitaxial growth of the film and forniation of the defects in the film. The effect of thedefects on the J_c was discussed.
