期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
金属氧化物TFT阈值对LCD显示屏可靠性的影响 被引量:4
1
作者 楼均辉 姜姝 +6 位作者 吴天一 符鞠建 夏兴达 迟宵 应变 李喜峰 《发光学报》 EI CAS CSCD 北大核心 2018年第3期383-387,共5页
TFT的器件特性是影响氧化物TFT驱动的LCD显示屏良率的关键因素。本文研究了氧化物TFT的关键特性参数(阈值,稳定性)对窄边框LCD显示屏的良率和可靠性的影响。氧化物TFT阈值过负,将会导致TFT无法正常关断,而使显示屏的外围移位寄存器(VSR... TFT的器件特性是影响氧化物TFT驱动的LCD显示屏良率的关键因素。本文研究了氧化物TFT的关键特性参数(阈值,稳定性)对窄边框LCD显示屏的良率和可靠性的影响。氧化物TFT阈值过负,将会导致TFT无法正常关断,而使显示屏的外围移位寄存器(VSR)电路失效。另外,在显示区域用于像素驱动的氧化物TFT的高温和背光照射下阈值持续负向漂移,最终会导致显示区域的驱动TFT漏电流过大,从而使显示屏出现串扰和残影不良。 展开更多
关键词 金属氧化物薄膜晶体管 阈值 LCD 可靠性
下载PDF
Effect of CuPc and MoO_3 co-evaporated layer on the conductivity of organic light emitting diodes
2
作者 于浩淼 +1 位作者 彭欢 侯晓远 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第9期459-463,共5页
Devices with copper phthalocyanine(CuPc):molybdenum trioxide(MoO3) co-evaporated layer were fabricated and the current–voltage(I–V) and capacitance–voltage(C–V) characteristics were measured. It has been ... Devices with copper phthalocyanine(CuPc):molybdenum trioxide(MoO3) co-evaporated layer were fabricated and the current–voltage(I–V) and capacitance–voltage(C–V) characteristics were measured. It has been found that for a given voltage, the current of the device with a co-evaporated layer is higher than those without the co-evaporated layer and it reaches the highest value if the ratio of MoO3 to CuPc is 1:1. Meanwhile, the C–V characteristics showed that only free holes exist in the function layer consisting of pure CuPc. However, charge transfer(CT) complexes exist in the function layer of a CuPc:MoO3 mixture. The charge transfer complexes do not contribute to the transport of the device efficiently under low applied fields but are disassociated into free carriers rapidly at applied fields higher than 1.7×105V/cm, which greatly increases the conductivity. 展开更多
关键词 CUPC MOO3 CONDUCTIVITY CAPACITANCE
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部