介绍了Ti0.76V0.24和Ti0.51V0.49两种合金及其氢化物的结构确定方法。研究了它们的吸氢性能,测得了吸氢的P C T曲线。该曲线分成两个主要区段:当H原子数与Ti V原子数之和的比值小于1 0时,为氢气的固溶区,并近似遵从Sievert(希乌尔)定律...介绍了Ti0.76V0.24和Ti0.51V0.49两种合金及其氢化物的结构确定方法。研究了它们的吸氢性能,测得了吸氢的P C T曲线。该曲线分成两个主要区段:当H原子数与Ti V原子数之和的比值小于1 0时,为氢气的固溶区,并近似遵从Sievert(希乌尔)定律;当该比值大于1 0后,有的曲线出现吸氢坪台区。分别计算了在固溶区和坪台区吸氢的热力学参数。展开更多
Zirconium (Zr) thin films deposited on Si (100) by pulsed laser deposition (PLD) at different pulse repetition rates are investigated. The deposited Zr films exhibit a polycrystalline structure, and the X-ray di...Zirconium (Zr) thin films deposited on Si (100) by pulsed laser deposition (PLD) at different pulse repetition rates are investigated. The deposited Zr films exhibit a polycrystalline structure, and the X-ray diffraction (XRD) patterns of the films show the α Zr phase. Due to the morphology variation of the target and the laser-plasma interaction, the deposition rate significantly decreases from 0.0431 A/pulse at 2 Hz to 0.0189A/pulse at 20 Hz. The presence of droplets on the surface of the deposited film, which is one of the main disadvantages of the PLD, is observed at various pulse repetition rates. Statistical results show that the dimension and the density of the droplets increase with an increasing pulse repetition rate. We find that the source of droplets is the liquid layer formed under the target surface. The dense nanoparticles covered on the film surface are observed through atomic force microscopy (AFM). The root mean square (RMS) roughness caused by valleys and islands on the film surface initially increases and then decreases with the increasing pulse repetition rate. The results of our investigation will be useful to optimize the synthesis conditions of the Zr films.展开更多
基金supported by the National Natural Science Foundation of China(Grant No.91126001)
文摘Zirconium (Zr) thin films deposited on Si (100) by pulsed laser deposition (PLD) at different pulse repetition rates are investigated. The deposited Zr films exhibit a polycrystalline structure, and the X-ray diffraction (XRD) patterns of the films show the α Zr phase. Due to the morphology variation of the target and the laser-plasma interaction, the deposition rate significantly decreases from 0.0431 A/pulse at 2 Hz to 0.0189A/pulse at 20 Hz. The presence of droplets on the surface of the deposited film, which is one of the main disadvantages of the PLD, is observed at various pulse repetition rates. Statistical results show that the dimension and the density of the droplets increase with an increasing pulse repetition rate. We find that the source of droplets is the liquid layer formed under the target surface. The dense nanoparticles covered on the film surface are observed through atomic force microscopy (AFM). The root mean square (RMS) roughness caused by valleys and islands on the film surface initially increases and then decreases with the increasing pulse repetition rate. The results of our investigation will be useful to optimize the synthesis conditions of the Zr films.