摘要
为了测量X射线辐射散射光子对剂量当量电离室的影响,根据ISO-4037建立X射线防护水平参考辐射场.采用PTW-32002 1L和PTW-32003 10L两个不同体积的球形空腔电离室在不同辐射质条件下通过影锥屏蔽法测量散射光子对不同电离室的影响程度.实验结果表明:散射光子对不同体积电离室影响程度不同,对于10 L球形电离室散射份额在2％左右,而对于1L球形电离室散射份额在4％左右.能量越高,散射光子的散射份额也会相对增大.
In order to measure the effects of X-ray on the scattered photon dose equivalent ionization chamber,the Xray protection level reference radiation field is established according to ISO-4037.The influence of scattered photons on different ionization chambers was measured by using 1L PTW-32002 and 10L PTW-32003 in two different volumes of spherical cavity chambers under different radiation conditions.The experimental results show that scattered photons are different in different volume ionization chambers.For the 10 L spherical ionization chamber,the scattering fraction is around 2％,but for the 1L spherical ionization chamber,the scattering fraction is about 4％.The higher energy,the scattering of photons will be relatively increased.
出处
《计量学报》
CSCD
北大核心
2016年第z1期-,共4页
Acta Metrologica Sinica
关键词
计量学
电离辐射
影锥屏蔽
散射光子
电离室
metrology
ionizing radiation
shadow cone shielding
scattered photons
ionization chamber
