摘要
选用150份河南小麦作为样品集,使用FOSS Infraxact Lab近红外光谱仪在570~1 850 nm波长下对湿面筋进行扫描,并用常规方法测定小麦的粉质仪参数和SDS沉淀值,探讨湿面筋近红外光谱和小麦品质特性之间的相关性.使用WinISIⅢ软件处理数据,结合修正偏最小二乘法建立了定标模型,湿面筋近红外光谱定标模型的形成时间、稳定时间、弱化度、粉质质量指数、SDS沉淀值定标决定系数r2在0.71~0.86之间,定标标准误差（SEC）范围为0.59~12.63,并且取得了良好的预测相关系数,这表明除吸水率之外,湿面筋近红外光谱和粉质仪参数、SDS沉淀值有较好相关性,并且其模型预测能力明显优于相同定标集下的面粉近红外模型.
Selecting 150 wheat varieties as the sample set,we measured the NIR spectra of wet gluten at 570 to 1850 nm by a FOSS Infraxact Lab NIR spectrometer, also measured the farinogram parameters and SDS sedimentation values of the wheat samples by conventional methods,and discussed the correlations between NIR spectra of wet gluten and the quality characteristics of wheat. We processed experimental data by WinISI III software,and then established a calibration model by modified partial least squares. The calibration determination coefficient r2and standard error of calibration of formation time,stability time,weakening degree,Farinograph quality number,and SDS sedimentation values were respectively 0.71 to 0.86 and 0.59 to 12.63;and better prediction correlation coefficient was obtained,which showed that the NIR spectra of wet gluten had good correlation with farinogram parameters and SDS sedimentation values except for the water absorption rate. The predictive ability of the model was superior to that of wheat NIR models under the same calibration set.
出处
《河南工业大学学报（自然科学版）》
CAS
北大核心
2013年第6期8-12,共5页
Journal of Henan University of Technology：Natural Science Edition
关键词
小麦
湿面筋
近红外光谱
品质分析
wheat
wet gluten
near-infrared spectrum
quality analysis
