摘要
A new classification of path-delay fault testability in a combinational circuit is presented in terms of testability of stuck-at faults in an equivalent circuit. Earlier results describing correlation of path-delay and stuck-at faults are either incomplete, or use a complex model of equivalent circuit based on timing parameters. It is shown here that a path-delay fault (rising or falling) is testable if and only if certain single or multiple stuck-at fault in the equivalent circuit is testable. Thus, all aspects of path-delay faults related to testability under various classification schemes can be interpreted using the stuck-at fault model alone. The results unify most of the existing concepts and provide a better understanding of path-delay faults in logic circuits. Keywords delay fault - false path - redundancy - stuck-at fault Regular PaperThis work was funded in part by Motorola India Electronics Ltd., Bangalore 560042, India.An earlier version of this paper appeared in the Proceedings of the 12th Int. Coaf. VLSI Design, Jan. 1999.Subhashis Majumder is a professor and course leader for the Computer Science and Engineering Department of International Institute of Information Technology, Kolkata. He started his career in Texas Instruments India Pvt. Ltd. and has over seven years of industry experience. He received his M. Tech degree in computer science from the Indian Statistical Institute, Kolkata in 1996. His undergraduate work was done in the Electronics and Telecommunication Engineering Dept. of the Jadvpur University, Koikata. He also worked as a research assistant in the Computer Eng. Dept. of Rutgers University for a year. He has led product development teams working on protocol stack development as well as VoIP. His current areas of interest include delay fault testing, wire routing, partitioning, approximation algorithms, and application of computational geometry to CAD problems.Bhargab B. Bhattacharya received the B.Sc. degree in physics from the Presidency College, Calcutta, the B.Tech. and M.Tech.
A new classification of path-delay fault testability in a combinational circuit is presented in terms of testability of stuck-at faults in an equivalent circuit. Earlier results describing correlation of path-delay and stuck-at faults are either incomplete, or use a complex model of equivalent circuit based on timing parameters. It is shown here that a path-delay fault (rising or falling) is testable if and only if certain single or multiple stuck-at fault in the equivalent circuit is testable. Thus, all aspects of path-delay faults related to testability under various classification schemes can be interpreted using the stuck-at fault model alone. The results unify most of the existing concepts and provide a better understanding of path-delay faults in logic circuits. Keywords delay fault - false path - redundancy - stuck-at fault Regular PaperThis work was funded in part by Motorola India Electronics Ltd., Bangalore 560042, India.An earlier version of this paper appeared in the Proceedings of the 12th Int. Coaf. VLSI Design, Jan. 1999.Subhashis Majumder is a professor and course leader for the Computer Science and Engineering Department of International Institute of Information Technology, Kolkata. He started his career in Texas Instruments India Pvt. Ltd. and has over seven years of industry experience. He received his M. Tech degree in computer science from the Indian Statistical Institute, Kolkata in 1996. His undergraduate work was done in the Electronics and Telecommunication Engineering Dept. of the Jadvpur University, Koikata. He also worked as a research assistant in the Computer Eng. Dept. of Rutgers University for a year. He has led product development teams working on protocol stack development as well as VoIP. His current areas of interest include delay fault testing, wire routing, partitioning, approximation algorithms, and application of computational geometry to CAD problems.Bhargab B. Bhattacharya received the B.Sc. degree in physics from the Presidency College, Calcutta, the B.Tech. and M.Tech.
