摘要
光谱响应曲线是探测器的重要技术参数之一,随着探测技术的发展,精确测量探测器的光谱响应曲线变得越来越重要.为了解决TDI CCD光谱响应曲线检测精度较低、检测方法不够准确等问题,提出了一套科学而准确的高精度TDI CCD光谱响应曲线检测方法.分析了TDI CCD光谱响应曲线的测量原理,采用了直接比较法测定待测TDI CCD的光谱响应曲线,基于具有稳定性高、优异响应能力的LED组,建立了光谱响应曲线的测量装置.计算所有波长的LED对应的TDI CCD光谱响应度,绘制在405~890 nm波长范围的光谱响应曲线.实验获取了TDI CCD光谱响应曲线,从曲线中可以看出,TDI CCD光谱响应范围为:405~890 nm.不确定度分析结果显示,TDI CCD相对光谱响应度曲线的最大不确定度约为4.15%,满足测量要求.
To solve the problems as low detection precision and lack of efficient detection methods,a more scientific and accurate method for spectral response detection of TDI CCD was put forward.The spectral response curve is one of the importan parameters of detector.With the development of detect technique,accurate measure for the spectral response curve of detector becomes more and more important.A measure principle which is based on the direct comparison measuring method for spectral response curve measurement of the TDI CCD is introduced.Based on the scientific-grade spectrometer with spectral response,a measurement facility was built.By calculating the corresponding spectral response of TDI CCD for LED of all wavelengths,it is drawn the spectral responsivity curve of TDI CCD in the wavelength scope from 405nm to 890nm.The spectral response curve of the TDI CCD was obtained.The curve indicates that the spectral response of TDI CCD is from 405nm to 890nm.The analysis of the uncertainty shows that the most largest uncertainty of measurement for spectral response curve of the TDI CCD is 4.15% and meets the requirement.
出处
《电子测量技术》
2014年第5期93-95,111,共4页
Electronic Measurement Technology